Box Elder Innovations’ Pulsed Electro-Acoustic (PEA) Measurement System is a laboratory-based system with the capability to perform controlled studies on space charge accumulation and migration behavior in dielectric materials. Results from these studies are essential in understanding existing dielectric materials and supporting development of advanced materials that will help mitigate problems caused by charge buildup and dielectric breakdown.
BEI is the only manufacturer of PEA systems in the United States and is set up to build these systems based on customer needs and requirements. Systems are designed for testing dielectric films and have the following features:
Potentials can be applied across the sample to simulate external potential (or electric) fields on the dielectric film for studying field-affected charge migration and dielectric breakdown behaviors.
The PEA Measurement System software capabilities include:
Model-based calculations help operators develop intuition and understanding of waveform behavior needed to interpret measurements and design experiments.
Our PEA Measurement System can be used to study embedded charge in dielectric films for applications such as:
Our system is applicable to research institutions or industries that have interest in studying the behavior of charged dielectric films.
A known cause for satellite failure is charge build-up in dielectric films used for thermal and electrical insulation in spacecraft. This build-up can lead to electrostatic discharge events that can damage satellite components. Also, charge build up in high voltage DC and dielectric aging in high voltage AC power transmission line insulator materials can reduce service life of transmission cables.
The Box Elder Innovations' PEA Measurement System is a laboratory-based system that provides a means to perform controlled studies on space charge accumulation and migration behavior in dielectric materials. Results from these studies are essential in supporting development of modified or new materials that will help mitigate problems caused by charge build -up and dielectric break-down.
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